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深圳磊坚代理销售日本NIKON尼康显微镜物镜CF Plan100x/0.95 OFN25 WD 0.3
Interferometry objectives are used in non-contact optical profile measurement devices to obtain surface maps and surface measurement parameters. They can be used to examine surface topography with very high precision—to within a fraction of the wavelength of light. In these objectives, a light beam passes through a beamsplitter, which directs the light to both the surface of the sample and a built-in reference mirror. The light reflected from these surfaces recombines and a fringe interference pattern is formed. The Michelson objectives provide comparatively longer working distances, wider fields of view and larger depth of focus, whereas the Mirau objectives are used in applications requiring higher magnification and/or numerical apertures. Use of the Nikon 200mm tube lens (#58- 520) allows these objectives to be integrated to a C-Mount camera.
Magnification | 2.5X | 5X | 10X | 20X | 50X | 100x |
Numerical Aperture | 0.075 | 0.13 | 0.30 | 0.40 | 0.55 | 0.7 |
Working Distance | 10.3mm | 9.3mm | 7.4mm | 4.7mm | 3.4mm | 2mm |
Focal Length | 80.0mm | 40.0mm | 20.0mm | 10.0mm | 4.0mm | 2mm |
Resolving Power | 3.7µm | 2.1µm | 0.92µm | 0.69µm | 0.50µm | 0.40µm |
Depth of Focus | 48.6µm | 416.2µm | 3.04µm | 1.71µm | 0.90µm | 0.56µm |
Field of View | ||||||
Eyepiece, 25 Diameter Field | 10.0mm | 5.0mm | 2.5mm | 1.25mm | 0.50mm | 0.25mm |
Eyepiece, 20 Diameter Field | 4.4mm | 2.2mm | 2mm | 1mm | 0.22mm | 0.2mm |
2/3" Sensor Camera (H x V) | 3.52 x 2.64mm | 1.76 x 1.32mm | 0.88 x 0.66mm | 0.44 x 0.33mm | 0.18 x 0.13mm | 0.011 x 0.08mm |
1/2" Sensor Camera (H x V) | 2.56 x 1.92mm | 1.28 x 0.96mm | 0.64 x 0.48mm | 0.32 x 0.24mm | 0.13 x 0.10mm | 0.08 x 0.06mm |
Weight | 440g | 280g | 125g | 130g | 150g | 200g |
商品名称
2.5X Nikon CF IC Epi Plan TI Interferometry Objective
5X Nikon CF IC Epi Plan TI Interferometry Objective
10X Nikon CF IC Epi Plan DI Interferometry Objective
20X Nikon CF IC Epi Plan DI Interferometry Objective
50X NIKON CF IC Epi Plan DI Interferometry Objective
100X Nikon CF IC Epi Plan DI Interferometry Objective
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