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深圳磊坚代理销售日本NIKON尼康显微镜物镜CF Plan100x/0.95 OFN25 WD 0.3

Interferometry objectives are used in non-contact optical profile measurement devices to obtain surface maps and surface measurement parameters. They can be used to examine surface topography with very high precision—to within a fraction of the wavelength of light. In these objectives, a light beam passes through a beamsplitter, which directs the light to both the surface of the sample and a built-in reference mirror. The light reflected from these surfaces recombines and a fringe interference pattern is formed. The Michelson objectives provide comparatively longer working distances, wider fields of view and larger depth of focus, whereas the Mirau objectives are used in applications requiring higher magnification and/or numerical apertures. Use of the Nikon 200mm tube lens (#58- 520) allows these objectives to be integrated to a C-Mount camera.

Magnification2.5X5X10X20X50X100x
Numerical Aperture0.0750.130.300.400.550.7
Working Distance10.3mm9.3mm7.4mm4.7mm3.4mm2mm
Focal Length80.0mm40.0mm20.0mm10.0mm4.0mm2mm
Resolving Power3.7µm2.1µm0.92µm0.69µm0.50µm0.40µm
Depth of Focus48.6µm416.2µm3.04µm1.71µm0.90µm0.56µm
Field of View
Eyepiece, 25 Diameter Field10.0mm5.0mm2.5mm1.25mm0.50mm0.25mm
Eyepiece, 20 Diameter Field4.4mm2.2mm2mm1mm0.22mm0.2mm
2/3" Sensor Camera (H x V)3.52 x 2.64mm1.76 x 1.32mm0.88 x 0.66mm0.44 x 0.33mm0.18 x 0.13mm0.011 x 0.08mm
1/2" Sensor Camera (H x V)2.56 x 1.92mm1.28 x 0.96mm0.64 x 0.48mm0.32 x 0.24mm0.13 x 0.10mm0.08 x 0.06mm
Weight440g280g125g130g150g200g

商品名称

2.5X Nikon CF IC Epi Plan TI Interferometry Objective
 
5X Nikon CF IC Epi Plan TI Interferometry Objective 
 
10X Nikon CF IC Epi Plan DI Interferometry Objective 
 
20X Nikon CF IC Epi Plan DI Interferometry Objective
 
50X NIKON CF IC Epi Plan DI Interferometry Objective
 
100X Nikon CF IC Epi Plan DI Interferometry Objective 

 





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